Date:
08/29/2012
MSI Principal Investigator Bin He (Biomedical Engineering and Director, Institute for Engineering in Medicine) is the senior author of a paper that appeared recently in Brain, a leading journal of neurology. The paper explains a new type of non-invasive brain scan that can help physicians diagnose and treat epilepsy. This study, which involved scans done immediately after a seizure instead of during it, is the first of its kind. The new scan, a form of EEG, uses over twice as many electrodes as most earlier types of scans.
Professor He uses MSI resources for computer simulations of the brain’s bioelectromagnetic field. To read a longer story about the recent paper, see the College of Science and Engineering website.